Proceedings of the International Conference on Measurements and Modeling of Computer Systems, SIGMETRICS 2004, June 10-14, 2004, New York, NY, USA

Edward G. Coffman Jr. Zhen Liu Arif Merchant Proceedings of the International Conference on Measurements and Modeling of Computer Systems, SIGMETRICS 2004, June 10-14, 2004, New York, NY, USA ACM 2004 db/conf/sigmetrics/sigmetrics2004.html 1-58113-873-3