BibTeX record conf/sice/FujishimaUYYITC20

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@inproceedings{DBLP:conf/sice/FujishimaUYYITC20,
  author       = {Mitsushiro Fujishima and
                  Shinobu Ueda and
                  Hisato Yoneda and
                  Takashi Yoshizawa and
                  Akio Ito and
                  Tetsuo Takeuchi and
                  Shinichiro Chino and
                  Kenji Kitayama and
                  Toshio Ono and
                  Takashi Matsukuma and
                  Hiroshi Yoshida and
                  Makoto Okuda and
                  Kenji Kumagai},
  title        = {A new methodology for providing insight into manufacturing using KPIs
                  based on {SMKL} (Smart Manufacturing Kaizen Level), utilizing industry
                  standards {(OPC} UA, FDT, PLCopen and AutomationML)},
  booktitle    = {59th Annual Conference of the Society of Instrument and Control Engineers
                  of Japan, {SICE} 2020, Chiang Mai, Thailand, September 23-26, 2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://ieeexplore.ieee.org/document/9240274},
  timestamp    = {Tue, 10 Nov 2020 11:41:23 +0100},
  biburl       = {https://dblp.org/rec/conf/sice/FujishimaUYYITC20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}