<?xml version="1.0"?>
<dblp>
<inproceedings key="conf/scia/KuparinenRTMBKPV05" mdate="2005-07-14">
<author>Toni Kuparinen</author>
<author>Oleg Rodionov</author>
<author>Pekka J. Toivanen</author>
<author>Jarno Mielik&#228;inen</author>
<author>Vladimir Bochko</author>
<author>Ate Korkalainen</author>
<author>Juha Parviainen</author>
<author>Erik Vartiainen</author>
<title>Fractal Dimension Analysis and Statistical Processing of Paper Surface Images Towards Surface Roughness Measurement.</title>
<pages>1218-1227</pages>
<year>2005</year>
<crossref>conf/scia/2005</crossref>
<booktitle>SCIA</booktitle>
<ee>http://dx.doi.org/10.1007/11499145_123</ee>
<url>db/conf/scia/scia2005.html#KuparinenRTMBKPV05</url>
</inproceedings>
</dblp>
