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BibTeX record conf/sbcci/ZhanC22
@inproceedings{DBLP:conf/sbcci/ZhanC22, author = {Suoyue Zhan and Chunhong Chen}, title = {Circuit Reliability Analysis with Considerations of Aging Effect}, booktitle = {35th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design, {SBCCI} 2022, Porto Alegre, Brazil, August 22-26, 2022}, pages = {1--5}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/SBCCI55532.2022.9893233}, doi = {10.1109/SBCCI55532.2022.9893233}, timestamp = {Thu, 06 Oct 2022 22:35:09 +0200}, biburl = {https://dblp.org/rec/conf/sbcci/ZhanC22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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