BibTeX record conf/sbcci/SaikiranGC22a

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@inproceedings{DBLP:conf/sbcci/SaikiranGC22a,
  author       = {Marampally Saikiran and
                  Mona Ganji and
                  Degang Chen},
  title        = {Digital Defect-Oriented Test Methodology for Flipped Voltage Follower
                  Low Dropout {(LDO)} Voltage Regulators},
  booktitle    = {35th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems
                  Design, {SBCCI} 2022, Porto Alegre, Brazil, August 22-26, 2022},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/SBCCI55532.2022.9893243},
  doi          = {10.1109/SBCCI55532.2022.9893243},
  timestamp    = {Sat, 30 Sep 2023 09:55:46 +0200},
  biburl       = {https://dblp.org/rec/conf/sbcci/SaikiranGC22a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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