BibTeX record conf/sbcci/NunesO18

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@inproceedings{DBLP:conf/sbcci/NunesO18,
  author       = {Rafael O. Nunes and
                  R. L. de Orio},
  title        = {Operational Amplifier Performance Degradation and Time-to-Failure
                  due to Electromigration},
  booktitle    = {31st Symposium on Integrated Circuits and Systems Design, {SBCCI}
                  2018, Bento Gon{\c{c}}alves, RS, Brazil, August 27-31, 2018},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/SBCCI.2018.8533265},
  doi          = {10.1109/SBCCI.2018.8533265},
  timestamp    = {Tue, 28 Jun 2022 16:39:26 +0200},
  biburl       = {https://dblp.org/rec/conf/sbcci/NunesO18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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