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BibTeX record conf/sbcci/LanotB14
@inproceedings{DBLP:conf/sbcci/LanotB14, author = {Alisson J. C. Lanot and Tiago R. Balen}, editor = {Edward David Moreno Ordonez and Rodolfo Jardim de Azevedo and Peter R. Kinget}, title = {Reliability Analysis of a 130nm Charge Redistribution {SAR} {ADC} under Single Event Effects}, booktitle = {Proceedings of the 27th Symposium on Integrated Circuits and Systems Design, Aracaju, Brazil, September 1-5, 2014}, pages = {17:1--17:7}, publisher = {{ACM}}, year = {2014}, url = {https://doi.org/10.1145/2660540.2660985}, doi = {10.1145/2660540.2660985}, timestamp = {Tue, 06 Nov 2018 16:58:27 +0100}, biburl = {https://dblp.org/rec/conf/sbcci/LanotB14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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