BibTeX record conf/sbcci/AlvesB09

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@inproceedings{DBLP:conf/sbcci/AlvesB09,
  author       = {Diogo Jos{\'{e}} Costa Alves and
                  Edna Barros},
  editor       = {Ivan Saraiva Silva and
                  Renato P. Ribas and
                  Calvin Plett},
  title        = {A logic built-in self-test architecture that reuses manufacturing
                  compressed scan test patterns},
  booktitle    = {Proceedings of the 22st Annual Symposium on Integrated Circuits and
                  Systems Design: Chip on the Dunes, {SBCCI} 2009, Natal, Brazil, August
                  31 - September 3, 2009},
  publisher    = {{ACM}},
  year         = {2009},
  url          = {https://doi.org/10.1145/1601896.1601923},
  doi          = {10.1145/1601896.1601923},
  timestamp    = {Mon, 19 Nov 2018 09:09:09 +0100},
  biburl       = {https://dblp.org/rec/conf/sbcci/AlvesB09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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