BibTeX record conf/rivf/KhwakhaliTTKTH22

download as .bib file

@inproceedings{DBLP:conf/rivf/KhwakhaliTTKTH22,
  author       = {Ushik Shrestha Khwakhali and
                  Nguyen Thu Tra and
                  Huynh Vinh Tin and
                  Truong Duc Khai and
                  Chung Quan Tin and
                  Loh Ing Hoe},
  title        = {Fabric Defect Detection Using Gray Level Co-occurence Matrix and Local
                  Binary Pattern},
  booktitle    = {{RIVF} International Conference on Computing and Communication Technologies,
                  {RIVF} 2022, Ho Chi Minh City, Vietnam, December 20-22, 2022},
  pages        = {226--231},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/RIVF55975.2022.10013920},
  doi          = {10.1109/RIVF55975.2022.10013920},
  timestamp    = {Mon, 05 Feb 2024 20:33:41 +0100},
  biburl       = {https://dblp.org/rec/conf/rivf/KhwakhaliTTKTH22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.