BibTeX record conf/rita/XuenKRMYJYM22

• > Home > conf/rita/XuenKRMYJYM22

@inproceedings{DBLP:conf/rita/XuenKRMYJYM22,
  author       = {Lim Shi Xuen and
                  Ismail Mohd Khairuddin and
                  Mohd Azraai Mohd Razman and
                  Jessnor Arif Mat{-}Jizat and
                  Edmund Yuen and
                  Haochuan Jiang and
                  Eng Hwa Yap and
                  Anwar P. P. Abdul Majeed},
  editor       = {Jun Jo and
                  Han{-}Lim Choi and
                  Mard{\'{e}} Helbig and
                  Hyondong Oh and
                  Jemin Hwangbo and
                  Chang{-}Hun Lee and
                  Bela Stantic},
  title        = {The Classification of Wafer Defects: {A} Support Vector Machine with
                  Different DenseNet Transfer Learning Models Evaluation},
  booktitle    = {Robot Intelligence Technology and Applications 7 - Results from the
                  10th International Conference on Robot Intelligence Technology and
                  Applications, RiTA 2022, Daejeon, South Korea, 7-9 December, 2022},
  series       = {Lecture Notes in Networks and Systems},
  volume       = {642},
  pages        = {304--309},
  publisher    = {Springer},
  year         = {2022},
  url          = {https://doi.org/10.1007/978-3-031-26889-2\_27},
  doi          = {10.1007/978-3-031-26889-2\_27},
  timestamp    = {Tue, 07 May 2024 20:13:02 +0200},
  biburl       = {https://dblp.org/rec/conf/rita/XuenKRMYJYM22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}