BibTeX record: conf/rcis/GatrellC11

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@inproceedings{DBLP:conf/rcis/GatrellC11,
  author    = {Matt Gatrell and
               Steve Counsell},
  title     = {Design patterns and fault-proneness a study of commercial C{\#} software},
  booktitle = {Proceedings of the Fifth {IEEE} International Conference on Research
               Challenges in Information Science, {RCIS} 2011, Gosier, Guadeloupe,
               France, 19-21 May, 2011},
  year      = {2011},
  pages     = {1--8},
  crossref  = {DBLP:conf/rcis/2011},
  url       = {http://dx.doi.org/10.1109/RCIS.2011.6006827},
  doi       = {10.1109/RCIS.2011.6006827},
  timestamp = {Tue, 30 Sep 2014 22:49:12 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/rcis/GatrellC11},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/rcis/2011,
  title     = {Proceedings of the Fifth {IEEE} International Conference on Research
               Challenges in Information Science, {RCIS} 2011, Gosier, Guadeloupe,
               France, 19-21 May, 2011},
  year      = {2011},
  publisher = {{IEEE}},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5992815},
  isbn      = {978-1-4244-8670-0},
  timestamp = {Tue, 30 Sep 2014 22:49:12 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/rcis/2011},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}