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BibTeX record conf/ram/SangSZCZ23
@inproceedings{DBLP:conf/ram/SangSZCZ23, author = {Tong Sang and Dai Sun and Wei Zhao and Ruohui Chen and Zeng Zeng}, title = {Wafer Map Defect Recognition and Accurate Localization Based on Defect Completion Algorithm}, booktitle = {{IEEE} International Conference on Cybernetics and Intelligent Systems, {CIS} 2023 and {IEEE} Conference on Robotics, Automation and Mechatronics, {RAM} 2023, Penang, Malaysia, June 9-12, 2023}, pages = {186--191}, publisher = {{IEEE}}, year = {2023}, url = {https://doi.org/10.1109/CIS-RAM55796.2023.10370761}, doi = {10.1109/CIS-RAM55796.2023.10370761}, timestamp = {Sun, 04 Aug 2024 19:42:21 +0200}, biburl = {https://dblp.org/rec/conf/ram/SangSZCZ23.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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