BibTeX record conf/ram/HanXSZ23

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@inproceedings{DBLP:conf/ram/HanXSZ23,
  author       = {Qing Han and
                  Yu Xia and
                  Xiupeng Shi and
                  Zeng Zeng},
  title        = {AutoML with Focal Loss for Defect Diagnosis and Prognosis in Smart
                  Manufacturing},
  booktitle    = {{IEEE} International Conference on Cybernetics and Intelligent Systems,
                  {CIS} 2023 and {IEEE} Conference on Robotics, Automation and Mechatronics,
                  {RAM} 2023, Penang, Malaysia, June 9-12, 2023},
  pages        = {180--185},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/CIS-RAM55796.2023.10370990},
  doi          = {10.1109/CIS-RAM55796.2023.10370990},
  timestamp    = {Tue, 16 Jan 2024 21:01:23 +0100},
  biburl       = {https://dblp.org/rec/conf/ram/HanXSZ23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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