BibTeX record conf/qrs/TianLTZ20

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@inproceedings{DBLP:conf/qrs/TianLTZ20,
  author       = {Yuli Tian and
                  Ning Li and
                  Jeff Tian and
                  Wei Zheng},
  title        = {How Well Just-In-Time Defect Prediction Techniques Enhance Software
                  Reliability?},
  booktitle    = {20th {IEEE} International Conference on Software Quality, Reliability
                  and Security, {QRS} 2020, Macau, China, December 11-14, 2020},
  pages        = {212--221},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/QRS51102.2020.00038},
  doi          = {10.1109/QRS51102.2020.00038},
  timestamp    = {Sun, 04 Aug 2024 16:27:07 +0200},
  biburl       = {https://dblp.org/rec/conf/qrs/TianLTZ20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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