BibTeX record conf/qrs/QinCH22

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@inproceedings{DBLP:conf/qrs/QinCH22,
  author       = {Runbing Qin and
                  Ningjiang Chen and
                  Yihui Huang},
  title        = {EDDNet: An Efficient and Accurate Defect Detection Network for the
                  Industrial Edge Environment},
  booktitle    = {22nd {IEEE} International Conference on Software Quality, Reliability
                  and Security, {QRS} 2022, Guangzhou, China, December 5-9, 2022},
  pages        = {854--863},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/QRS57517.2022.00090},
  doi          = {10.1109/QRS57517.2022.00090},
  timestamp    = {Tue, 28 Mar 2023 19:49:47 +0200},
  biburl       = {https://dblp.org/rec/conf/qrs/QinCH22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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