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BibTeX record conf/qrs/JiLMM23
@inproceedings{DBLP:conf/qrs/JiLMM23, author = {Yi Ji and Ryan Lekivetz and Simon Mak and Joseph Morgan}, title = {BayesFLo: Bayesian Fault Localization for Software Testing}, booktitle = {23rd {IEEE} International Conference on Software Quality, Reliability, and Security, {QRS} 2023 Companion, Chiang Mai, Thailand, October 22-26, 2023}, pages = {865--866}, publisher = {{IEEE}}, year = {2023}, url = {https://doi.org/10.1109/QRS-C60940.2023.00019}, doi = {10.1109/QRS-C60940.2023.00019}, timestamp = {Tue, 05 Mar 2024 11:59:30 +0100}, biburl = {https://dblp.org/rec/conf/qrs/JiLMM23.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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