BibTeX record conf/qrs/HasanainLE18

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@inproceedings{DBLP:conf/qrs/HasanainLE18,
  author       = {Wafa Hasanain and
                  Yvan Labiche and
                  Sigrid Eldh},
  title        = {An Analysis of Complex Industrial Test Code Using Clone Analysis},
  booktitle    = {2018 {IEEE} International Conference on Software Quality, Reliability
                  and Security, {QRS} 2018, Lisbon, Portugal, July 16-20, 2018},
  pages        = {482--489},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/QRS.2018.00061},
  doi          = {10.1109/QRS.2018.00061},
  timestamp    = {Sun, 12 Nov 2023 02:15:26 +0100},
  biburl       = {https://dblp.org/rec/conf/qrs/HasanainLE18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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