Measurement of the Switching Activity of CMOS Digital Circuits at the Gate Level.

C. Baena Jorge Juan-Chico Manuel J. Bellido Paulino Ruiz-de-Clavijo Carlos J. Jiménez Manuel Valencia Measurement of the Switching Activity of CMOS Digital Circuits at the Gate Level. 353-362 2002 conf/patmos/2002 PATMOS http://springerlink.metapress.com/openurl.asp?genre=article&issn=0302-9743&volume=2451&spage=0353 db/conf/patmos/patmos2002.html#BaenaJBCJV02