BibTeX record conf/patmos/BadereddineGVPL05

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@inproceedings{DBLP:conf/patmos/BadereddineGVPL05,
  author       = {Nabil Badereddine and
                  Patrick Girard and
                  Arnaud Virazel and
                  Serge Pravossoudovitch and
                  Christian Landrault},
  editor       = {Vassilis Paliouras and
                  Johan Vounckx and
                  Diederik Verkest},
  title        = {Controlling Peak Power Consumption During Scan Testing: Power-Aware
                  DfT and Test Set Perspectives},
  booktitle    = {Integrated Circuit and System Design, Power and Timing Modeling, Optimization
                  and Simulation, 15th International Workshop, {PATMOS} 2005, Leuven,
                  Belgium, September 21-23, 2005, Proceedings},
  series       = {Lecture Notes in Computer Science},
  volume       = {3728},
  pages        = {540--549},
  publisher    = {Springer},
  year         = {2005},
  url          = {https://doi.org/10.1007/11556930\_55},
  doi          = {10.1007/11556930\_55},
  timestamp    = {Tue, 21 Mar 2023 21:02:37 +0100},
  biburl       = {https://dblp.org/rec/conf/patmos/BadereddineGVPL05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}