Neil Spring George F. Riley Passive and Active Measurement - 12th International Conference, PAM 2011, Atlanta, GA, USA, March 20-22, 2011. Proceedings 6579 2011 http://dx.doi.org/10.1007/978-3-642-19260-9 978-3-642-19259-3 PAM Lecture Notes in Computer Science Springer db/conf/pam/pam2011.html