BibTeX record conf/nvmts/TamuraMWKE18

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@inproceedings{DBLP:conf/nvmts/TamuraMWKE18,
  author       = {Ryo Tamura and
                  I. Mori and
                  N. Watanabe and
                  Hiroki Koike and
                  Tetsuo Endoh},
  title        = {Accurate error bit mode analysis of {STT-MRAM} chip with a novel current
                  measurement module implemented to gigabit class memory test system},
  booktitle    = {Non-Volatile Memory Technology Symposium, {NVMTS} 2018, Sendai, Japan,
                  October 22-24, 2018},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/NVMTS.2018.8603113},
  doi          = {10.1109/NVMTS.2018.8603113},
  timestamp    = {Fri, 04 Dec 2020 08:54:17 +0100},
  biburl       = {https://dblp.org/rec/conf/nvmts/TamuraMWKE18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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