BibTeX record conf/norchip/OsimiryUKR16

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@inproceedings{DBLP:conf/norchip/OsimiryUKR16,
  author       = {Emmanuel Ovie Osimiry and
                  Raimund Ubar and
                  Sergei Kostin and
                  Jaan Raik},
  title        = {A novel random approach to diagnostic test generation},
  booktitle    = {{IEEE} Nordic Circuits and Systems Conference, {NORCAS} 2016, Copenhagen,
                  Denmark, November 1-2, 2016},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/NORCHIP.2016.7792915},
  doi          = {10.1109/NORCHIP.2016.7792915},
  timestamp    = {Sun, 25 Oct 2020 23:05:24 +0100},
  biburl       = {https://dblp.org/rec/conf/norchip/OsimiryUKR16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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