BibTeX record conf/nccet/SunCLL17

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@inproceedings{DBLP:conf/nccet/SunCLL17,
  author       = {Yan Sun and
                  Yuesheng Cao and
                  Jinwen Li and
                  Tiejun Li},
  editor       = {Weixia Xu and
                  Liquan Xiao and
                  Jinwen Li and
                  Chengyi Zhang and
                  Zhenzhen Zhu},
  title        = {An Efficient Model for Soft Error Vulnerability of Dynamic Circuits},
  booktitle    = {Computer Engineering and Technology - 21st {CCF} Conference, {NCCET}
                  2017, Xiamen, China, August 16-18, 2017, Revised Selected Papers},
  series       = {Communications in Computer and Information Science},
  volume       = {600},
  pages        = {133--142},
  publisher    = {Springer},
  year         = {2017},
  url          = {https://doi.org/10.1007/978-981-10-7844-6\_13},
  doi          = {10.1007/978-981-10-7844-6\_13},
  timestamp    = {Fri, 29 Jun 2018 13:27:37 +0200},
  biburl       = {https://dblp.org/rec/conf/nccet/SunCLL17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}