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BibTeX record conf/natw/ValiN15
@inproceedings{DBLP:conf/natw/ValiN15, author = {Amin Vali and Nicola Nicolici}, title = {Satisfiability-Based Analysis of Failing Traces during Post-silicon Debug}, booktitle = {24th {IEEE} North Atlantic Test Workshop, {NATW} 2015, Johnson City, NY, USA, May 11-13, 2015}, pages = {17--22}, publisher = {{IEEE}}, year = {2015}, url = {https://doi.org/10.1109/NATW.2015.16}, doi = {10.1109/NATW.2015.16}, timestamp = {Wed, 16 Oct 2019 14:14:53 +0200}, biburl = {https://dblp.org/rec/conf/natw/ValiN15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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