BibTeX record conf/natw/MossVJ20

download as .bib file

@inproceedings{DBLP:conf/natw/MossVJ20,
  author       = {Stephen Moss and
                  Elanchezhian Veeramani and
                  Joris Angelo Sundaram Jerome},
  title        = {Passive Intermodulation {(PIM)} Test and Measurement},
  booktitle    = {29th {IEEE} North Atlantic Test Workshop, {NATW} 2020, Albany, NY,
                  USA, June 17-24, 2020},
  pages        = {1--3},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/NATW49237.2020.9153075},
  doi          = {10.1109/NATW49237.2020.9153075},
  timestamp    = {Thu, 06 Aug 2020 14:52:56 +0200},
  biburl       = {https://dblp.org/rec/conf/natw/MossVJ20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.