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BibTeX record conf/natw/MossVJ20
@inproceedings{DBLP:conf/natw/MossVJ20, author = {Stephen Moss and Elanchezhian Veeramani and Joris Angelo Sundaram Jerome}, title = {Passive Intermodulation {(PIM)} Test and Measurement}, booktitle = {29th {IEEE} North Atlantic Test Workshop, {NATW} 2020, Albany, NY, USA, June 17-24, 2020}, pages = {1--3}, publisher = {{IEEE}}, year = {2020}, url = {https://doi.org/10.1109/NATW49237.2020.9153075}, doi = {10.1109/NATW49237.2020.9153075}, timestamp = {Thu, 06 Aug 2020 14:52:56 +0200}, biburl = {https://dblp.org/rec/conf/natw/MossVJ20.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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