BibTeX record conf/natw/AlaouiTBV18

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@inproceedings{DBLP:conf/natw/AlaouiTBV18,
  author       = {Nabil El Belghiti Alaoui and
                  Patrick Tounsi and
                  Alexandre Boyer and
                  Arnaud Viard},
  title        = {New testing approach using near electromagnetic field probing intending
                  to upgrade in-circuit testing of high density PCBAs},
  booktitle    = {27th {IEEE} North Atlantic Test Workshop, {NATW} 2018, Essex, VT,
                  USA, May 7-9, 2018},
  pages        = {1--8},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/NATW.2018.8388867},
  doi          = {10.1109/NATW.2018.8388867},
  timestamp    = {Mon, 09 Aug 2021 14:54:02 +0200},
  biburl       = {https://dblp.org/rec/conf/natw/AlaouiTBV18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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