Takashi Watanabe Akira Kusano Takayuki Fujiwara Hiroyasu Koshimizu 3D Precise Inspection of Electronic Devices by Single Stereo Vision. 449-452 2007 MVA http://b2.cvl.iis.u-tokyo.ac.jp/mva/proceedings/2007CD/papers/13-05.pdf conf/mva/2007 db/conf/mva/mva2007.html#WatanabeKFK07