BibTeX record conf/mue/AnJW17

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@inproceedings{DBLP:conf/mue/AnJW17,
  author       = {Jeongmin An and
                  Sangmoon Jung and
                  Yoojae Won},
  editor       = {James Jong Hyuk Park and
                  Shu{-}Ching Chen and
                  Kim{-}Kwang Raymond Choo},
  title        = {Study on Integrity Verification and Compatibility-Conflict Analysis
                  for Safe Patching},
  booktitle    = {Advanced Multimedia and Ubiquitous Engineering - MUE/FutureTech 2017,
                  Seoul, Korea, 22-24 May 2017},
  series       = {Lecture Notes in Electrical Engineering},
  volume       = {448},
  pages        = {187--192},
  year         = {2017},
  url          = {https://doi.org/10.1007/978-981-10-5041-1\_32},
  doi          = {10.1007/978-981-10-5041-1\_32},
  timestamp    = {Sat, 05 Sep 2020 17:55:30 +0200},
  biburl       = {https://dblp.org/rec/conf/mue/AnJW17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}