BibTeX record conf/mtdt/WuCLWLWCHPCK06

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@inproceedings{DBLP:conf/mtdt/WuCLWLWCHPCK06,
  author       = {Jia{-}Lin Wu and
                  Hua{-}Ching Chien and
                  Chien{-}Wei Liao and
                  Cheng{-}Yen Wu and
                  Chih{-}Yuan Lee and
                  Houng{-}Chi Wei and
                  Shih{-}Hsien Chen and
                  Hann{-}Ping Hwang and
                  Saysamone Pittikoun and
                  Travis Cho and
                  Chin{-}Hsing Kao},
  title        = {Comparison of Electrical and Reliability Characteristics of Different
                  Tunnel Oxides in {SONOS} Flash Memory},
  booktitle    = {14th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2006), 2-4 August 2006, Taipei, Taiwan},
  pages        = {80--84},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/MTDT.2006.8},
  doi          = {10.1109/MTDT.2006.8},
  timestamp    = {Fri, 24 Mar 2023 00:03:36 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/WuCLWLWCHPCK06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}