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BibTeX record conf/mtdt/RedekerCEXU02
@inproceedings{DBLP:conf/mtdt/RedekerCEXU02, author = {Michael Redeker and Bruce F. Cockburn and Duncan G. Elliott and Yunan Xiang and Sue Ann Ung}, title = {Fault Modeling and Pattern-Sensitivity Testing for a Multilevel {DRAM}}, booktitle = {10th {IEEE} International Workshop on Memory Technology, Design, and Testing {(MTDT} 2002), 10-12 July 2002, Isle of Bendor, France}, pages = {117--122}, publisher = {{IEEE} Computer Society}, year = {2002}, url = {https://doi.org/10.1109/MTDT.2002.1029772}, doi = {10.1109/MTDT.2002.1029772}, timestamp = {Fri, 24 Mar 2023 00:03:36 +0100}, biburl = {https://dblp.org/rec/conf/mtdt/RedekerCEXU02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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