Shyue-Kung Lu Shih-Chang Huang Built-in Self-Test and Repair (BISTR) Techniques for Embedded RAMs. 60-64 2004 conf/mtdt/2004 MTDT http://doi.ieeecomputersociety.org/10.1109/MTDT.2004.7 db/conf/mtdt/mtdt2004.html#LuH04