BibTeX record conf/mtdt/JeeCIP00

download as .bib file

@inproceedings{DBLP:conf/mtdt/JeeCIP00,
  author       = {Alvin Jee and
                  Jonathon E. Colburn and
                  V. Swamy Irrinki and
                  Mukesh Puri},
  title        = {Optimizing Memory Tests by Analyzing Defect Coverage},
  booktitle    = {8th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2000), 7-8 August 2000, San Jose, CA, {USA}},
  pages        = {20--28},
  publisher    = {{IEEE} Computer Society},
  year         = {2000},
  url          = {https://doi.org/10.1109/MTDT.2000.868611},
  doi          = {10.1109/MTDT.2000.868611},
  timestamp    = {Fri, 24 Mar 2023 00:03:36 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/JeeCIP00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.