HsuHYW06'

@inproceedings{DBLP:conf/mtdt/HsuHYW06,
  author    = {Mu-Hsien Hsu and
               Yu-Tsao Hsing and
               Jen-Chieh Yeh and
               Cheng-Wen Wu},
  title     = {Fault-Pattern Oriented Defect Diagnosis for Flash Memory},
  booktitle = {MTDT},
  year      = {2006},
  pages     = {3-8},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/MTDT.2006.13},
  crossref  = {DBLP:conf/mtdt/2006},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/mtdt/2006,
  title     = {14th IEEE International Workshop on Memory Technology, Design,
               and Testing (MTDT 2006), 2-4 August 2006, Taipei, Taiwan},
  booktitle = {MTDT},
  publisher = {IEEE Computer Society},
  year      = {2006},
  isbn      = {0-7695-2572-5},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}