BibTeX record: conf/mtdt/HsuHYW06

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@inproceedings{DBLP:conf/mtdt/HsuHYW06,
  author    = {Mu{-}Hsien Hsu and
               Yu{-}Tsao Hsing and
               Jen{-}Chieh Yeh and
               Cheng{-}Wen Wu},
  title     = {Fault-Pattern Oriented Defect Diagnosis for Flash Memory},
  booktitle = {14th {IEEE} International Workshop on Memory Technology, Design, and
               Testing {(MTDT} 2006), 2-4 August 2006, Taipei, Taiwan},
  year      = {2006},
  pages     = {3--8},
  crossref  = {DBLP:conf/mtdt/2006},
  url       = {http://doi.ieeecomputersociety.org/10.1109/MTDT.2006.13},
  doi       = {10.1109/MTDT.2006.13},
  timestamp = {Thu, 02 Oct 2014 14:58:30 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/mtdt/HsuHYW06},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/mtdt/2006,
  title     = {14th {IEEE} International Workshop on Memory Technology, Design, and
               Testing {(MTDT} 2006), 2-4 August 2006, Taipei, Taiwan},
  year      = {2006},
  publisher = {{IEEE} Computer Society},
  isbn      = {0-7695-2572-5},
  timestamp = {Thu, 02 Oct 2014 14:58:30 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/mtdt/2006},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}