BibTeX record conf/mtdt/HamdiouiGRE00

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@inproceedings{DBLP:conf/mtdt/HamdiouiGRE00,
  author       = {Said Hamdioui and
                  Ad J. van de Goor and
                  Mike Rodgers and
                  David Eastwick},
  title        = {March Tests for Realistic Faults in Two-Port Memories},
  booktitle    = {8th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2000), 7-8 August 2000, San Jose, CA, {USA}},
  pages        = {73--78},
  publisher    = {{IEEE} Computer Society},
  year         = {2000},
  url          = {https://doi.org/10.1109/MTDT.2000.868618},
  doi          = {10.1109/MTDT.2000.868618},
  timestamp    = {Fri, 24 Mar 2023 00:03:36 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/HamdiouiGRE00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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