Said Hamdioui Georgi Gaydadjiev A. J. van de Goor The State-of-Art and Future Trends in Testing Embedded Memories. 54-59 2004 conf/mtdt/2004 MTDT http://doi.ieeecomputersociety.org/10.1109/MTDT.2004.23 db/conf/mtdt/mtdt2004.html#HamdiouiGG04