HamdiouiGG04'

BibTeX

@inproceedings{DBLP:conf/mtdt/HamdiouiGG04,
  author    = {Said Hamdioui and
               Georgi Gaydadjiev and
               A. J. van de Goor},
  title     = {The State-of-Art and Future Trends in Testing Embedded Memories},
  booktitle = {MTDT},
  year      = {2004},
  pages     = {54-59},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/MTDT.2004.23},
  crossref  = {DBLP:conf/mtdt/2004},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/mtdt/2004,
  title     = {12th IEEE International Workshop on Memory Technology, Design,
               and Testing (MTDT 2004), 9-10 August 2004, San Jose, CA,
               USA},
  booktitle = {MTDT},
  publisher = {IEEE Computer Society},
  year      = {2004},
  isbn      = {0-7695-2193-2},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}