BibTeX record conf/mtdt/GoorHA04

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@inproceedings{DBLP:conf/mtdt/GoorHA04,
  author       = {Ad J. van de Goor and
                  Said Hamdioui and
                  Zaid Al{-}Ars},
  title        = {The Effectiveness of the Scan Test and Its New Variants},
  booktitle    = {12th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2004), 9-10 August 2004, San Jose, CA, {USA}},
  pages        = {26--31},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.ieeecomputersociety.org/10.1109/MTDT.2004.22},
  doi          = {10.1109/MTDT.2004.22},
  timestamp    = {Fri, 24 Mar 2023 00:03:36 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/GoorHA04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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