BibTeX record conf/mtdt/Al-ArsAG01

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@inproceedings{DBLP:conf/mtdt/Al-ArsAG01,
  author       = {Zaid Al{-}Ars and
                  Ad J. van de Goor},
  title        = {Transient Faults in DRAMs: Concepts, Analysis and Impact on Tests},
  booktitle    = {9th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2001), 6-7 August 2001, San Jose, CA, {USA}},
  pages        = {59--64},
  publisher    = {{IEEE} Computer Society},
  year         = {2001},
  url          = {https://doi.org/10.1109/MTDT.2001.945229},
  doi          = {10.1109/MTDT.2001.945229},
  timestamp    = {Fri, 24 Mar 2023 00:03:36 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/Al-ArsAG01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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