Applying Defect-Based Test to Embedded Memories in a COT Model.

Robert C. Aitken Applying Defect-Based Test to Embedded Memories in a COT Model. 72- 2003 conf/mtdt/2003 MTDT http://doi.ieeecomputersociety.org/10.1109/MTDT.2003.1222364 db/conf/mtdt/mtdt2003.html#Aitken03