BibTeX record conf/mlmi2/QiYZ20

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@inproceedings{DBLP:conf/mlmi2/QiYZ20,
  author       = {Shengxiang Qi and
                  Jiarong Yang and
                  Zhenyi Zhong},
  title        = {A Review on Industrial Surface Defect Detection Based on Deep Learning
                  Technology},
  booktitle    = {{MLMI} 2020: The 3rd International Conference on Machine Learning
                  and Machine Intelligence, Hangzhou, China, September, 2020},
  pages        = {24--30},
  publisher    = {{ACM}},
  year         = {2020},
  url          = {https://doi.org/10.1145/3426826.3426832},
  doi          = {10.1145/3426826.3426832},
  timestamp    = {Fri, 17 Mar 2023 10:43:53 +0100},
  biburl       = {https://dblp.org/rec/conf/mlmi2/QiYZ20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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