BibTeX record conf/mixdes/AlaouiTBV19

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@inproceedings{DBLP:conf/mixdes/AlaouiTBV19,
  author       = {Nabil El Belghiti Alaoui and
                  Patrick Tounsi and
                  Alexandre Boyer and
                  Arnaud Viard},
  editor       = {Andrzej Napieralksi},
  title        = {Detecting {PCB} Assembly Defects Using Infrared Thermal Signatures},
  booktitle    = {26th International Conference on Mixed Design of Integrated Circuits
                  and Systems, {MIXDES} 2019, Rzesz{\'{o}}w, Poland, June 27-29,
                  2019},
  pages        = {345--349},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.23919/MIXDES.2019.8787089},
  doi          = {10.23919/MIXDES.2019.8787089},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/mixdes/AlaouiTBV19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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