BibTeX record conf/metroxraine/WiefelsLSSWN23

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@inproceedings{DBLP:conf/metroxraine/WiefelsLSSWN23,
  author       = {Stefan Wiefels and
                  Xiaohua Liu and
                  Kristoffer Schnieders and
                  Mathias Schumacher and
                  Rainer Waser and
                  Lutz Nielen},
  title        = {Advanced Electrical Characterization of Memristive Arrays for Neuromorphic
                  Applications},
  booktitle    = {{IEEE} International Conference on Metrology for eXtended Reality,
                  Artificial Intelligence and Neural Engineering, MetroXRAINE 2023,
                  Milano, Italy, October 25-27, 2023},
  pages        = {1069--1074},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/MetroXRAINE58569.2023.10405805},
  doi          = {10.1109/METROXRAINE58569.2023.10405805},
  timestamp    = {Thu, 29 Feb 2024 20:53:01 +0100},
  biburl       = {https://dblp.org/rec/conf/metroxraine/WiefelsLSSWN23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}