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BibTeX record conf/metroi/PetritoliLS20
@inproceedings{DBLP:conf/metroi/PetritoliLS20, author = {Enrico Petritoli and Fabio Leccese and Giuseppe Schirripa Spagnolo}, title = {In-Line Quality Control in Semiconductors Production and Availability for Industry 4.0}, booktitle = {2020 {IEEE} International Workshop on Metrology for Industry 4.0 {\&} IoT, Roma, Italy, June 3-5, 2020}, pages = {665--668}, publisher = {{IEEE}}, year = {2020}, url = {https://doi.org/10.1109/MetroInd4.0IoT48571.2020.9138296}, doi = {10.1109/METROIND4.0IOT48571.2020.9138296}, timestamp = {Tue, 29 Dec 2020 18:30:27 +0100}, biburl = {https://dblp.org/rec/conf/metroi/PetritoliLS20.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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