BibTeX record conf/metroi/MassaroMGX19

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@inproceedings{DBLP:conf/metroi/MassaroMGX19,
  author       = {Alessandro Massaro and
                  Ivano Manfredonia and
                  Angelo Galiano and
                  Benny Xhahysa},
  title        = {Advanced Process Defect Monitoring Model and Prediction Improvement
                  by Artificial Neural Network in Kitchen Manufacturing Industry: a
                  Case of Study},
  booktitle    = {2nd Workshop on Metrology for Industry 4.0 and IoT MetroInd4.0{\&}IoT
                  2019, Naples, Italy, June 4-6, 2019},
  pages        = {64--67},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/METROI4.2019.8792872},
  doi          = {10.1109/METROI4.2019.8792872},
  timestamp    = {Tue, 06 Jul 2021 18:51:15 +0200},
  biburl       = {https://dblp.org/rec/conf/metroi/MassaroMGX19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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