BibTeX
@inproceedings{DBLP:conf/metrics/ShullBBBCLPRTZ02,
author = {Forrest Shull and
Victor R. Basili and
Barry W. Boehm and
A. Winsor Brown and
Patricia Costa and
Mikael Lindvall and
Daniel Port and
Ioana Rus and
Roseanne Tesoriero and
Marvin V. Zelkowitz},
title = {What We Have Learned About Fighting Defects},
booktitle = {IEEE METRICS},
year = {2002},
pages = {249-},
ee = {http://csdl.computer.org/comp/proceedings/metrics/2002/1339/00/13390249abs.htm},
crossref = {DBLP:conf/metrics/2002},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/metrics/2002,
title = {8th IEEE International Software Metrics Symposium (METRICS
2002), 4-7 June 2002, Ottawa, Canada},
booktitle = {IEEE METRICS},
publisher = {IEEE Computer Society},
year = {2002},
isbn = {0-7695-1339-5},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2003-10-29 by Michael Ley (ley@uni-trier.de)