BibTeX
@inproceedings{DBLP:conf/metrics/BifflG01,
author = {Stefan Biffl and
Walter J. Gutjahr},
title = {Influence Of Team Size And Defect Detection Technique On
Inspection Effectiveness},
booktitle = {IEEE METRICS},
year = {2001},
pages = {63-},
ee = {http://csdl.computer.org/comp/proceedings/metrics/2001/1043/00/10430063abs.htm},
crossref = {DBLP:conf/metrics/2001},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/metrics/2001,
title = {7th IEEE International Software Metrics Symposium (METRICS
2001), 4-6 April 2001, London, England},
booktitle = {IEEE METRICS},
publisher = {IEEE Computer Society},
year = {2001},
isbn = {0-7695-1043-4},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2003-10-29 by Michael Ley (ley@uni-trier.de)