Benoit Baudry Yves Le Traon Gerson Sunyé Jean-Marc Jézéquel Measuring and Improving Design Patterns Testability. 50- 2003 conf/metrics/2003 IEEE METRICS http://csdl.computer.org/comp/proceedings/metrics/2003/1987/00/19870050abs.htm db/conf/metrics/metrics2003.html#BaudryTSJ03