BibTeX record conf/mdis/RezaeiRNSK22

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@inproceedings{DBLP:conf/mdis/RezaeiRNSK22,
  author       = {Ahmad Rezaei and
                  Johannes Richter and
                  Johannes Nau and
                  Detlef Streitferdt and
                  Michael Kirchhoff},
  editor       = {Dana Simian and
                  Laura Florentina Stoica},
  title        = {Transparency and Traceability for AI-Based Defect Detection in {PCB}
                  Production},
  booktitle    = {Modelling and Development of Intelligent Systems - 8th International
                  Conference, {MDIS} 2022, Sibiu, Romania, October 28-30, 2022, Revised
                  Selected Papers},
  series       = {Communications in Computer and Information Science},
  volume       = {1761},
  pages        = {54--72},
  publisher    = {Springer},
  year         = {2022},
  url          = {https://doi.org/10.1007/978-3-031-27034-5\_4},
  doi          = {10.1007/978-3-031-27034-5\_4},
  timestamp    = {Sat, 11 Mar 2023 00:11:48 +0100},
  biburl       = {https://dblp.org/rec/conf/mdis/RezaeiRNSK22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}