BibTeX record conf/m2vip/ZhengWYY22

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@inproceedings{DBLP:conf/m2vip/ZhengWYY22,
  author       = {Haoran Zheng and
                  Shanghai Wei and
                  Wei Yu and
                  Brent R. Young},
  title        = {Multi-label Classification for Metal Defects from {SEM} Images using
                  Deep Learning},
  booktitle    = {28th International Conference on Mechatronics and Machine Vision in
                  Practice, {M2VIP} 2022, Nanjing, China, November 16-18, 2022},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/M2VIP55626.2022.10041065},
  doi          = {10.1109/M2VIP55626.2022.10041065},
  timestamp    = {Sun, 06 Oct 2024 21:10:48 +0200},
  biburl       = {https://dblp.org/rec/conf/m2vip/ZhengWYY22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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