BibTeX record conf/latw/ShinTST15

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@inproceedings{DBLP:conf/latw/ShinTST15,
  author       = {Hosoon Shin and
                  Sheldon X.{-}D. Tan and
                  Guoyong Shi and
                  Esteban Tlelo{-}Cuautle},
  title        = {Rare event diagnosis by iterative failure region locating and elite
                  learning sample selection},
  booktitle    = {16th Latin-American Test Symposium, {LATS} 2015, Puerto Vallarta,
                  Mexico, March 25-27, 2015},
  pages        = {1--5},
  publisher    = {{IEEE} Computer Society},
  year         = {2015},
  url          = {https://doi.org/10.1109/LATW.2015.7102505},
  doi          = {10.1109/LATW.2015.7102505},
  timestamp    = {Thu, 23 Mar 2023 23:59:12 +0100},
  biburl       = {https://dblp.org/rec/conf/latw/ShinTST15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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